Books By D.c. Joy
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 | Scanning Electron Microscopy and X-ray Microanalysis Joseph I. Goldstein; Dale E. Newbury; D.C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Linda C. Sawyer; J.R. Michael |
format Hardcover | release date September 1, 2002 | Compare Prices |
 | Principles of Analytical Electron Microscopy |
format Hardcover | release date January 1, 2001 | Compare Prices |
| Electron Holography: Proceedings of the International Workshop on Electron Holography, Holiday Inn World's Fair, Knoxville, Tennessee, USA, 29-31 August 1994 |
format Hardcover | release date June 26, 1995 | Compare Prices | |
 | SEM Microcharacterization of Semiconductors |
format Hardcover | release date November 16, 1989 | Compare Prices |
 | Advanced Scanning Electron Microscopy and X-Ray Microanalysis Patrick Echlin; C.E. Fiori; Joseph Goldstein; D.C. Joy; Dale E. Newbury |
format Hardcover | release date March, 1986 | Compare Prices |
 | Introduction to Electron Holography |
format Hardcover | release date April, 1999 | Compare Prices |
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